This is the program for the 2010 Joint Statistical Meetings in Vancouver, British Columbia.

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Keyword Search Criteria: Unbiased test returned 3 record(s)
Sunday, 08/01/2010
A Parametric Test for Correlated Time-to-Event Data with a Failure Rate Change
Gang Han, Moffitt Cancer Center & Research Institute; Ji-Hyun Lee, Moffitt Cancer Center & Research Institute
4:05 PM

Monday, 08/02/2010
Improved Survival Modeling Using a Reduced Piecewise Exponential Approach
Gang Han, Moffitt Cancer Center & Research Institute; Michael J. Schell, Moffitt Cancer Center; Jongphil Kim, Moffitt Cancer Center & Research Institute
12:05 PM

Tuesday, 08/03/2010
Optimizing a Testing Procedure Based on Kernel Density Estimation for Comparing Two Treatments
Sibabrata Banerjee, Merck & Co., Inc.; Sunil Dhar, New Jersey Institute of Technology; Farid Kianifard, Novartis Pharmaceuticals Corporation; Hanzhe Zheng, Merck & Co., Inc.; Venkata Sasikiran Goteti, Merck & Co., Inc.





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